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Immunological Aspects of Allergy and Allergic Diseases - Clinical Aspects of Autoimmune Diseases - Bog af E. Rajka - Paperback

DKK 801.95

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Protocol Test Systems VIII - Proceedings of the IFIP WG6.1 TC6 Eighth International Workshop on Protocol Test Systems, September 1995 - Bog - Paperbac

DKK 2223.95

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Multi-Chip Module Test Strategies - Bog - Paperback

This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.

DKK 1023.95

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Process-Aware SRAM Design and Test - Bog af Andrei Pavlov & Manoj Sachdev -

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

DKK 1815.95

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Power-Aware Testing and Test Strategies for Low Power Devices - Bog - Paperback

This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

DKK 1232.95

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Power-Aware Testing and Test Strategies for Low Power Devices - Bog - Hardback

This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

DKK 1783.95

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Test and Design-for-Testability in Mixed-Signal Integrated Circuits - Bog - Hardback

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.

DKK 1770.95

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Test and Design-for-Testability in Mixed-Signal Integrated Circuits - Bog - Paperback

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.

DKK 1624.95

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Clinical Application of Neuropsychological Test Batteries - Bog - Paperback

Initially, the problem was con ceptualized in terms of whether the VA should encourage wider use of the long-established Halstead-Reitan Neuropsychological Test Battery (HRB) or promote more extensive use of the recently developed Luria Nebraska Neuropsychological Test Battery (LNNB).

DKK 848.95

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Introduction to Advanced System-on-Chip Test Design and Optimization - Bog af Erik Larsson - Hardback

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

DKK 1787.95

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Introduction to Advanced System-on-Chip Test Design and Optimization - Bog af Erik Larsson - Paperback

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

DKK 1727.95

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Test Resource Partitioning for System-on-a-Chip - Bog af Vikram Iyengar & Anshuman Chandra - Hardback

Talks about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. This book aims to position test resource partitioning in the context of SOC test automation. It presents various techniques for the partitioning and optimization of the three major SOC test resources.

DKK 1228.95

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Microelectronic Test Structures for CMOS Technology - Bog af Manjul Bhushan & Mark B. Ketchen - Hardback

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products.

DKK 1747.95

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Test Anxiety - The State of the Art - Bog af Moshe Zeidner - Paperback

This work has also benefitted from the author's lo- standing and productive collaboration with leading contributors to test anxiety theory and research, and his active participation in national and international conferences devoted to understanding test anxiety, including those convened by the Society for Test Anxiety Research (STAR).

DKK 1728.95

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Bog af Krishnendu Chakrabarty - Hardback

Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing.

DKK 1330.95

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Bog af Krishnendu Chakrabarty - Paperback

Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing.

DKK 1330.95

1

Design for AT-Speed Test, Diagnosis and Measurement - Bog - Paperback

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

DKK 1718.95

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Linear Models for Optimal Test Design - Bog af Wim J. van der Linden - Hardback

Reflecting on the history of test design, this book presents a standard language for modeling test design problems as instances of multi-objective constrained optimization. It discusses test design models for a variety of problems from the daily practice of testing, and illustrates their use with the help of empirical examples.

DKK 1332.95

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The Kernel Method of Test Equating - Bog af Alina A. von Davier - Paperback

KE is applied to the four major equating designs and to both Chain Equating and Post-Stratification Equating for the Non-Equivalent groups with Anchor Test Design. The authors assume some familiarity with linear and equipercentile test equating, and with matrix algebra.

DKK 1028.95

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Oscillation-Based Test in Mixed-Signal Circuits - Bog af Gloria Huertas Sanchez, Diego Vazquez Garcia de la Vega, mfl. - Hardback

This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short.

DKK 1798.95

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Designer's Guide to Built-In Self-Test - Bog af Charles E. Stroud - Paperback

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

DKK 2212.95

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Designer's Guide to Built-In Self-Test - Bog af Charles E. Stroud - Hardback

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

DKK 2267.95

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System Test and Diagnosis - Bog af William R. Simpson & John W. Sheppard - Paperback

System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail.

DKK 1725.95

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Digital System Test and Testable Design - Using HDL Models and Architectures - Bog af Zainalabedin Navabi - Hardback

This book is about digital system testing and testable design. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions.

DKK 1255.95

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Digital System Test and Testable Design - Using HDL Models and Architectures - Bog af Zainalabedin Navabi - Paperback