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Testing Static Random Access Memories - Defects, Fault Models and Test Patterns - Bog af Said Hamdioui - Hardback

Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

DKK 1166.95

2

Hair Cell Regeneration, Repair, and Protection - Bog - Paperback

Not male pattern baldness, but the loss of sensory hair, is a very serious topic. Sensory hair cells convert sound and motion into our sense of hearing, movement, and head position. In mammals, the loss of hair cells is irreversible. Hair cells in other vertebrates are capable of regenerating and recovering partial or complete function.

DKK 1221.95

2

Hair Cell Regeneration, Repair, and Protection - Bog - Hardback

Not male pattern baldness, but the loss of sensory hair, is a very serious topic. Sensory hair cells convert sound and motion into our sense of hearing, movement, and head position. In mammals, the loss of hair cells is irreversible. Hair cells in other vertebrates are capable of regenerating and recovering partial or complete function.

DKK 1443.95

2

Microelectronic Test Structures for CMOS Technology - Bog af Manjul Bhushan & Mark B. Ketchen - Hardback

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products.

DKK 1747.95

2

Multi-Chip Module Test Strategies - Bog - Paperback

This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.

DKK 1023.95

2

Single-Cell Protein Analysis - Bog - Hardback

This detailed volume serves as a collection of methods for single-cell protein analysis, created by combining different protocols, taking advantage of new emerging technologies, and improving upon conventional methods to guide researchers aiming to perform protein analysis in single cells. Ranging from simple to complex, conventional to the most current technologies, these chapters offer readers the ability to choose the best suited methodologies for them, based on the sample type and the available..

DKK 1501.95

2

Protocol Test Systems VIII - Proceedings of the IFIP WG6.1 TC6 Eighth International Workshop on Protocol Test Systems, September 1995 - Bog - Paperbac

DKK 2223.95

2

Test Resource Partitioning for System-on-a-Chip - Bog af Vikram Iyengar & Anshuman Chandra - Hardback

Talks about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. This book aims to position test resource partitioning in the context of SOC test automation. It presents various techniques for the partitioning and optimization of the three major SOC test resources.

DKK 1228.95

2

An Introduction to Bayesian Analysis - Theory and Methods - Bog af Jayanta K. Ghosh, Mohan Delampady, mfl. - Hardback

This book is a contemporary introduction to theory, methods and computation in Bayesian Analysis. It focuses on topics that have stood the test of time and on emerging areas. No other such book is available in the market.

DKK 1501.95

2

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Process-Aware SRAM Design and Test - Bog af Andrei Pavlov & Manoj Sachdev -

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

DKK 1815.95

2

Power-Aware Testing and Test Strategies for Low Power Devices - Bog - Paperback

This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

DKK 1232.95

2

Power-Aware Testing and Test Strategies for Low Power Devices - Bog - Hardback

This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

DKK 1783.95

2

Real and Functional Analysis - Part B Functional Analysis - Bog - Paperback

DKK 1123.95

2

Clinical Application of Neuropsychological Test Batteries - Bog - Paperback

Initially, the problem was con ceptualized in terms of whether the VA should encourage wider use of the long-established Halstead-Reitan Neuropsychological Test Battery (HRB) or promote more extensive use of the recently developed Luria Nebraska Neuropsychological Test Battery (LNNB).

DKK 848.95

2

Test and Design-for-Testability in Mixed-Signal Integrated Circuits - Bog - Hardback

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.

DKK 1770.95

2

Test and Design-for-Testability in Mixed-Signal Integrated Circuits - Bog - Paperback

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.

DKK 1624.95

2

Introduction to Advanced System-on-Chip Test Design and Optimization - Bog af Erik Larsson - Hardback

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

DKK 1787.95

2

Introduction to Advanced System-on-Chip Test Design and Optimization - Bog af Erik Larsson - Paperback

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

DKK 1727.95

2

Undergraduate Analysis - Bog af Serge Lang - Paperback

This is a logically self-contained introduction to analysis, suitable for students who have had two years of calculus. The book centers around those properties that have to do with uniform convergence and uniform limits in the context of differentiation and integration. Topics discussed include the classical test for convergence of series, Fourier series, polynomial approximation, the Poisson kernel, the construction of harmonic functions on the disc, ordinary differential equation, curve integrals,..

DKK 517.95

2

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Pris (EUR)

Testing Static Random Access Memories - Defects, Fault Models and Test Patterns - Bog af Said Hamdioui - Hardback

Hair Cell Regeneration, Repair, and Protection - Bog - Paperback

Hair Cell Regeneration, Repair, and Protection - Bog - Hardback

Microelectronic Test Structures for CMOS Technology - Bog af Manjul Bhushan & Mark B. Ketchen - Hardback

Multi-Chip Module Test Strategies - Bog - Paperback

Single-Cell Protein Analysis - Bog - Hardback

Protocol Test Systems VIII - Proceedings of the IFIP WG6.1 TC6 Eighth International Workshop on Protocol Test Systems, September 1995 - Bog - Paperbac

Test Resource Partitioning for System-on-a-Chip - Bog af Vikram Iyengar & Anshuman Chandra - Hardback

An Introduction to Bayesian Analysis - Theory and Methods - Bog af Jayanta K. Ghosh, Mohan Delampady, mfl. - Hardback

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Process-Aware SRAM Design and Test - Bog af Andrei Pavlov & Manoj Sachdev -

Power-Aware Testing and Test Strategies for Low Power Devices - Bog - Paperback

Power-Aware Testing and Test Strategies for Low Power Devices - Bog - Hardback

Real and Functional Analysis - Part B Functional Analysis - Bog - Paperback

Clinical Application of Neuropsychological Test Batteries - Bog - Paperback

Test and Design-for-Testability in Mixed-Signal Integrated Circuits - Bog - Hardback

Test and Design-for-Testability in Mixed-Signal Integrated Circuits - Bog - Paperback

Introduction to Advanced System-on-Chip Test Design and Optimization - Bog af Erik Larsson - Hardback

Introduction to Advanced System-on-Chip Test Design and Optimization - Bog af Erik Larsson - Paperback

Undergraduate Analysis - Bog af Serge Lang - Paperback

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