Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits - Bog af Gordon W. Roberts & Albert K. Lu - Hardback

Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits - Gordon W. Roberts

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing..