Introduction to Advanced System-on-Chip Test Design and Optimization - Bog af Erik Larsson - Hardback

Introduction to Advanced System-on-Chip Test Design and Optimization - Erik Larsson

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.