Testing Static Random Access Memories - Defects, Fault Models and Test Patterns - Bog af Said Hamdioui - Hardback

Testing Static Random Access Memories - Defects, Fault Models and Test Patterns - Said Hamdioui

Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.