Built-in-Self-Test and Digital Self-Calibration for RF SoCs - Bog af Mohammed Ismail & Sleiman Bou-Sleiman - Paperback

Built-in-Self-Test and Digital Self-Calibration for RF SoCs - Mohammed Ismail

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).