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Testing and Reliable Design of CMOS Circuits - Bog af Niraj K. Jha & Sandip Kundu - Paperback

Fra DKK 1712.95
Mærke Springer-Verlag New York Inc.
EAN / Stregkode 9781461288183
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Testing and Reliable Design of CMOS Circuits - Niraj K. Jha

In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing.

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