Hybrid Code-Based Test Data Compression and Decompression for VLSI Circuits - Bog af Kalamani Chinnappa Gounder - Paperback

Hybrid Code-Based Test Data Compression and Decompression for VLSI Circuits - Kalamani Chinnappa Gounder

Doctoral Thesis / Dissertation from the year 2018 in the subject Computer Science - Applied, grade: 6, Anna University, course: PhD, language: English, abstract: Test data compression is an effective method for reducing test data volume and memory requirement with relatively small cost. An effective test structure for embedded hard cores is easy to implement and it is also capable of producing high-quality tests as part of the design flow.The purpose of Test data compression intends to reduce Test..