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Test Generation of Crosstalk Delay Faults in VLSI Circuits - Bog af S. Jayanthy & M.C. Bhuvaneswari - Hardback

Fra DKK 1616.95
Mærke Springer Verlag, Singapore
EAN / Stregkode 9789811324925
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Test Generation of Crosstalk Delay Faults in VLSI Circuits - S. Jayanthy

The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.

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DKK 1617.95